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We will describe our characterization of artifacts in limited data X-ray tomography reconstructions with arbitrary data. We provide estimates of the strength of the added artifacts in some cases, and we illustrate our results using standard and non-standard limited data tomography problems with real and simulated data. The work is based on a microlocal analysis of the X-ray transform and backprojection, and it can be applied to a range of limited data problems.
This presentation is part of Minisymposium “MS7 - Limited data problems in imaging (2 parts)”
organized by: Bernadette Hahn (University of Würzburg) , Gaël Rigaud (Saarland University) , Jürgen Frikel (OTH Regensburg) .