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We consider the propagation of waves in a waveguide with a localized defect. We propose a spectral approach to compute, for a given setting (geometry, material properties,...), frequencies for which there is an incident field such that the associated scattered field is null at infinity. In such a situation, the defect can not be identified from measurements made with devices located far from it. In other words it is invisible to the incident field.
This presentation is part of Minisymposium “MS1 - Inverse scattering and electrical impedance tomography (2 parts)”
organized by: Nuutti Hyvönen (Aalto University) , Roland Griesmaier (Karlsruhe Institute of Technology) .