Resolution measures in Electron Microscopy reconstructionsMS51

In this talk we will review the different definitions of resolution use in Electron Microscopy. We will explore its statistical distributions and the conditions under which these are analytically determined. As will be seen, strong statements about resolution must be taken with care. We will also explore the relationship between the particle size, the number of images required to achieve a given resolution and the image formation physics.

This presentation is part of Minisymposium “MS51 - Algorithms for Single Particle Reconstruction in Cryo-Electron Microscopy (cryo-EM). (3 parts)
organized by: Roy Lederman (Yale University) , Joakim Andén (Flatiron Institute) .

Carlos Oscar Sorzano (Centro Nacional Biotecnología)
computer vision, image reconstruction, image registration, image representation, statistical inverse estimation methods