Using electron tomography, the three-dimensional structural and chemical information of materials can be characterized at the nanometer level. The most commonly used image signals are acquired using scanning TEM (STEM), which is a high-resolution and non-spectral modality. In addition, the spectral imaging mode called energy dispersive X-ray spectroscopy (EDS) can be adopted in electron tomography to directly map the chemical composition in 3D. However, EDS imaging presents low signal-to-noise ratios, which limits the resolution. In this presentation, I will introduce the approaches to combine the two complementary modalities in one tomographic reconstruction process for acquiring high-resolution chemical information in 3D.

This presentation is part of Minisymposium “MS68 - Multi-channel image reconstruction approaches”
organized by: Jakob Jorgensen (University of Manchester) , Daniil Kazantsev (University of Manchester) .

Authors:

Joost Batenburg (CWI, Amsterdam)

Zhichao Zhong (Centrum Wiskunde & Informatica)

Keywords:

computed tomography, electron tomography, image reconstruction, image segmentation, inverse problems, spectral ct