Multi-Angle Total Internal Reflection Fluorescence (MA-TIRF) microscopy is a recent technique which provides depth information. Its axial resolution is typically 20 nm, but the lateral resolution is unfortunately not as good. We investigate the combination of MA-TIRF and single molecule emission microscopy techniques, so as to remove that shortcoming. This yields an inverse problem where the measurements combine partial Laplace and convolution operations. We present a gridless total-variation minimization approach, with theoretical and numerical results.

This presentation is part of Minisymposium “MS31 - Variational Approaches for Regularizing Nonlinear Geometric Data (3 parts)”
organized by: Martin Storath (Universität Heidelberg) , Martin Holler (École Polytechnique, Université Paris Saclay) , Andreas Weinmann (Hochschule Darmstadt) .

Authors:

Vincent Duval (INRIA)

Keywords:

image deblurring, image reconstruction, inverse problems, sparse recovery, total variation of measures